Roles and Responsibilities:

Specific Job Duties: Work on optimization of transistor performance and targeting to maximize product yield, and work to improve quality and reliability for several products across multiple Customer account(s) while also developing and implementing ideas to improve systematic yield and productivity issues across the factory. Ensure targeting of transistor focused Electrical Test (ET) trends to Customer/Product Specifications and perform timely root cause study to shifts or abnormality. Analyze process interactions (inline metrology, FDC) to ET while also understanding ET data effect on Parametric Yield. Own Parametric Yield and Wafer Acceptance Electrical Test (WAT) management for one or more Customer Accounts/Products from New Product Introduction (NPI) Stage thru Mass Production. Execute, and analyze experiments to optimize Transistor performance/variation with end goal of improving Parametric Yield. Drive Task Force Teams to solve systematic Yield and other Fab-wide issues. Support unit process (CMP, Etch) or process integration team with evaluation of device impact for key change points (cost/step reduction, throughput improvement) across the factory. Generate written reports and oral presentations for internal management, external teams, and sometimes company executives. (Multiple Openings)
Shift: 1st 
Skills and Qualifications:

Education, Training, Certification(s) and Minimum years of experience required

Minimum Requirements: Master’s degree in Electrical Engineering, Computer Engineering, Electronics Engineering, or a related field and 24 months of experience in the job offered or in a related occupation.

Knowledge, Skills, Abilities, Software, and Tools

Requires 24 months of experience involving the following:
1. Device monitoring, characterization, and root cause analysis;
2. Electrical characterization;
3. Semiconductor process flow;
4. Wafer scrap investigation;
5. Analysis of low yield and functionality issues; and
6. Assessed and qualified new tools and process changes.