What are the responsibilities and job description for the Wafer Backside Processing Technician - Second Shift position at Teledyne FLIR?
Job Summary:
Performs a variety of technical tasks associated with backside wafer processing and assembly operations. This role supports production and engineering priorities in a cleanroom environment, focusing on die preparation, hybridization, wicking, and wire bonding processes.
This is a second shift position from 2:30 pm to 11:00 pm M-F.
Primary Duties & Responsibilities:
Hybridization Support
- Clean and inspect diced die using approved solvents and cleaning methods
- As needed operate hybridization tools and maintain process parameters for yield optimization
Wicking & Underfill
- Perform wicking operations to ensure proper underfill application
- Monitor curing cycles and maintain accurate process logs
Wirebonding
- Prepare substrates, load programs, perform wirebonding
- Inspect bonds for quality and reliability using microscopes and metrology tools
General Responsibilities
- Maintain detailed records of SPC charts, tool usage, and consumables
- Follow ISO Class 6 cleanroom protocols and 6S principles
- Schedule and coordinate WIP for efficient movement between backside processes
- Inspect and disposition nonconforming product
Job Qualifications:
- High School Diploma or equivalent; technical coursework preferred
- 1–2 years of experience in semiconductor assembly or wafer processing
- Familiarity with cleanroom operations and chemical handling
- Ability to read and follow paper and digital travelers
- Strong attention to detail, communication, and teamwork skills
Physical Requirements:
- Ability to stand and walk for extended periods (up to 8–10 hours per shift)
- Frequent bending, stooping, and reaching to handle wafers and assemblies
- Manual dexterity for handling small components and precision tools
- Ability to lift and carry items up to 25 lbs
- Comfortable working in full cleanroom gowning (coveralls, gloves, mask, eye protection)
- Visual acuity for detailed inspection under microscopes
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